The 67th Crystallographic Seminar (67. Konwersatorium Krystalograficzne) was held from June 24 to 26, 2026, in Wrocław, Poland.  LANScientific Co., Ltd. and its partners were jointly invited to participate in the seminar, joining experts and scholars from the Institute of Low Temperature and Structure Research of the Polish Academy of Sciences (INTiBS PAN) and the Polish Crystallographic Society to exchange views on frontier technologies and applications in X-ray crystallography.

The seminar was organized by the Crystallography Committee of the Polish Academy of Sciences and co-organized by INTiBS PAN and the Polish Crystallographic Society, making it one of the largest and most academically prestigious annual events in Poland's crystallography community. The venue, INTiBS PAN, is a leading Polish research institution in low-temperature physics and structural research. Founded in 1966, the institute is known 

erization under low-temperature and high-magnetic-field conditions. The seminar's topics covered a wide range of subjects, including fundamental and applied research on ideal and real crystal structures, synchrotron and conventional X-ray methods, neutron and electron scattering, phase transitions and crystal growth, as well as novel computational and characterization methods.

LANScientific has long been dedicated to the field of X-ray analytical instruments. Its product line includes X-ray diffractometers (XRD), X-ray fluorescence spectrometers (XRF/TXRF/EDXRF), and Raman spectrometers, accumulating deep technical expertise in X-ray crystallography and material structure analysis.

During the seminar, LANScientific and its partners held multiple exchanges with crystallography researchers from Poland and across Europe on the practical application of portable and benchtop XRD in material structure characterization.

LANScientific stated that INTiBS PAN, as a leading Polish research institution, provided a high-level platform for dialogue during this exchange. In the future, LANScientific will continue to focus on independent R&D, promote the application of domestic X-ray analytical instruments in crystallography and materials science, and work with global research partners to explore further possibilities in structure characterization technology.