LANScientific SuperSEM Benchtop Scanning Electron Microscope, using cutting-edge electron optical technology, realizes real-time joint analysis of scanning electron microscope (SEM) and energy dispersive X-ray spectroscopy (EDS) detector. SEM technology is used to obtain structural information on the surface of the sample, and EDS is used for chemical element analysis and characterization. LSEM-100 not only simplifies the analysis process of many materials but also provides high-quality qualitative and quantitative composition information while imaging through real-time superposition of color element distribution and SEM images.
In addition, SuperSEM is also equipped with high acceleration voltage, multi-angle observation and supporting data analysis software, which can automatically focus, scan quickly, and observe the distribution of sample elements in real time in video mode, ensuring accurate and efficient image acquisition and analysis. It is suitable for the analysis of materials such as metals, ceramics, batteries, coatings, cement, and soft matter, and is a powerful assistant for scientific research and industrial testing.
metallic materials, non-metallic materials |
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 Earth science |
Surface coatings and films |
Criminal investigation |
| Edition | SuperSEM N10、SuperSEM N10eX、SuperSEM N10Plus、SuperSEM N10XL |
| Size | 570mm x 292 mm x 515mm （L×W×H,Different versions differ slightly） |
| Weight | 55KG (Different versions differ slightly) |
| The maximum size sample | 90 mm (diameter) 40 mm (thickness) |
| 3D moving sample stage | X：25 mm Y：25 mm Z：30 mm |
| Sample stage size | Φ25 x H30mm |
Multiplying Power | ×10～×100,000（Photo magnification） ×25～×250,000（Display multiplier） |
| Electron Gun | Tungsten filament |
| Accelerating voltage | 5 kV、10 kV、15 kV |
| Working distance | 7-35mm |
| Vacuum mode | high vacuum, low vacuum |
| Detector | Backscattered Electron Detector BS ESecondary Electron Detector SE(Optional) Energy Spectrometer EDS(Optional) |
| Video Mode | 1270x720 pixels, customizable photo proportions |
| Scanning speed | Fastest 0.4us/pix, multi-level optional |
| Energy spectrum function | Real-time element content analysis, component mapping |
