LANScientific SuperSEM N10 desktop scanning electron microscope, using cutting-edge electron optical technology, realizes real-time joint analysis of scanning electron microscope (SEM) and energy dispersive X-ray spectroscopy (EDS) detector. SEM technology is used to obtain structural information on the surface of the sample, and EDS is used for chemical element analysis and characterization. LSEM-100 not only simplifies the analysis process of many materials but also provides high-quality qualitative and quantitative composition information while imaging through real-time superposition of color element distribution and SEM images.
In addition, SuperSEM is also equipped with high acceleration voltage, multi-angle observation and supporting data analysis software, which can automatically focus, scan quickly, and observe the distribution of sample elements in real time in video mode, ensuring accurate and efficient image acquisition and analysis. It is suitable for the analysis of materials such as metals, ceramics, batteries, coatings, cement, and soft matter, and is a powerful assistant for scientific research and industrial testing.
In materials science, SEM clearly reveals surface microstructures, such as grain size and distribution, aiding in preliminary structural analysis. The backscattered electron detector differentiates material phases by atomic number contrast, supporting phase identification. The EDS detector enables basic composition analysis, identifying element types and approximate content. These functions provide essential microscopic data for initial material research and performance evaluation. |
Commercial manufacture In quality control and process optimization, SEM is used to inspect surface machining marks, wear, and micro-defects on components, ensuring product precision. It identifies material composition differences, helping detect impurities or inconsistencies, and analyzes material composition to verify compliance with design specifications. This aids in improving product quality, reducing defect rates, and optimizing production workflows. |
In biological applications, SEM is used to observe the surface structures of cells and tissues, clearly revealing details such as cell contours and microvilli, helping researchers understand cellular morphology and function. The backscattered electron detector distinguishes differences in cellular composition, providing preliminary information on internal cell structures. The EDS detector analyzes the distribution of elements like calcium and phosphorus within cells, supplying fundamental data for biomaterials and cell biology research. |
Earth science In Earth sciences, SEM is used to observe the morphology, size, and arrangement of mineral crystals, aiding scientists in inferring formation environments and distinguishing between different mineral compositions for intuitive rock analysis. Combined with EDS, it enables precise elemental analysis to identify mineral types, providing essential microscopic evidence for geologists studying Earth's history and geological processes. |
New energy materials In new energy materials research, SEM provides crucial microscopic insights for development and performance optimization. It clearly reveals particle size and pore structure of battery electrode materials, distinguishes between material phases, and helps assess uniformity. The EDS detector analyzes composition to ensure material purity and consistency. |
Metallic material In metallurgical analysis, SEM is used to observe the microstructure of metals, clearly revealing grain size and grain boundary morphology, providing a basis for understanding fundamental material properties. It also helps distinguish between different phases, supporting phase analysis. The EDS detector analyzes metal composition and detects impurity elements. |
| Edition | SuperSEM N10 | SuperSEM N10eX | SuperSEM N10eV |
| Size（W×L×H） | 292×570×515 mm | 292×570×515 mm | 292×570×515 mm |
| Weight | 55kg | 56kg | 57kg |
| Acceleration voltage | 5 kV、10 kV、15 kV | 5 kV、10 kV、15 kV | 5 kV、10 kV、15 kV 20 kV、25 kV、30 kV |
| 3D moving sample stage | X:±25 mm Y:±25 mm Z:30 mm | X:±25 mm Y:±25 mm Z:30 mm | X:±25 mm Y:±25 mm Z:30 mm |
| The maximum size sample | 90 mm (diameter) 40 mm (thickness) | 90 mm (diameter) 40 mm (thickness) | 90 mm (diameter) 40 mm (thickness) |
| Multiplying Power | ×10～×100,000（Photo magnification） ×25～×250,000（Display multiplier） | ×10～×100,000（Photo magnification） ×25～×250,000（Display multiplier） | ×10～×100,000（Photo magnification） ×25～×250,000（Display multiplier） |
Electron Gun | Pre-centered cartridge tungsten filament | Pre-centered cartridge tungsten filament | Pre-centered cartridge tungsten filament |
| Detector | BSE:High-Sensitivity 4-segment BSE detector | BSE:High-Sensitivity 4-segment BSE detector SE:Secondary electron detector EDS：Real-time energy spectrum pseudo-color imaging | BSE:High-Sensitivity 4-segment BSE detector SE:Secondary electron detector EDS：Real-time energy spectrum pseudo-color imaging |
| EDS Parameter | / | Detector type: silicon drift detector Detection area: 30mm2 Resolution: 130eV Range of elemental analysis: B -Cf | Detector type: silicon drift detector Detection area: 30mm2 Resolution: 130eV Range of elemental analysis: B -Cf |
| Image signal | Backscattered electron | Backscattered electron Self-developed real-time energy spectrum detector Secondary electron Mix (Backscattered electron +Secondary electron+Real-time energy spectrum pseudo-color imaging) | Backscattered electron Self-developed real-time energy spectrum detector Secondary electron Mix (Backscattered electron +Secondary electron+Real-time energy spectrum pseudo-color imaging) |
| Vacuum mode | Standard Charge-up reduction | Conductor: BSE Standard Charge-up reduction | Conductor: BSE Standard Charge-up reduction |
