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FRINGE Family (Benchtop)

FRINGE EV

Powerful KW-class power, excellent performace benchtop XRD harvester
FRINGE EV

FRINGE EV benchtop X-Ray diffractometer in the X-Ray beam through the sola slit, divergent slit irradiation on the sample, the sample stage is located in the center of the goniometer, based on the reflection geometry θs-θd, X-Ray beam in the meeting of Bragg's law, diffraction phenomenon occurs in a specific direction, through the anti-scatter slit, Sora slit, receive slit to reach the X-Ray detector, and finally through the data processing system in the analysis software to display the acquired diffraction map.

FRINGE EV is a high-power miniaturized benchtop X-Ray diffractometer, independently developed by the company, which can quickly characterize the main phase of samples in powder, block or thin film forms, crystal structure analysis, material structure analysis and crystallinity determination, with the characteristics of easy operation, high precision, good stability, wide range of applications, etc., and is an ideal solution for material research, universities and research institutes, building materials, biomedicine and many other fields.

Advantage

Air spring large window lift door

Air spring large window lift door not only save desktop space,but also  suitable for each desk,and effectively improve space utilization rate.

Built-in water circulation cooling system

FRINGE EV built-in water circulation cooling system, no need to add additional chiller. Software can real-time display the X-ray tube water temperature, flow, flow rate and other information.

Safety

It has automatic cutting protection device in the test process, safety linkage lock device, the sample chamber is fully enclosed after closing, and the operation interface has the function of closing the sample chamber.

XRD for everyone

After obtaining diffraction data, CrystalX automatically carry out phase analysis, and give the percentage of each component of the phase, greatly reducing the requirements of the user, just need to click "start testing", the rest to the CrystalX software.

Integrated sola slits

The integrated sora slits, without any motion-adjustable parts, increase the reliability of the goniometer system, allowing the FRINGE EV desktop XRD to be installed on in-vehicle laboratory platforms.


Product Parameters

Goniometerθ-θ vertical goniometer, diffractive circle radius 150mm
Angle measuring range of Angle meter-3° - +150°
PrecisionThe  deviation of <±0.02° in the full spectrum
FWHM<0.04°2θ
Sola slitThe integrated sora slits, without any motion-adjustable parts, increase the reliability of the goniometer system, allowing the FRINGE desktop XRD to be installed on in-vehicle laboratory platforms
X-Ray tubeCermet X-Ray tube, with maximum power of 2.2KW, focus: 1mm x 10 mm, default configuration cu target, optional Co, Cr, Mo target
High Voltage Generator Power1200W, maximum tube voltage 40KV, maximum tube current 30mA.
Size580mm x 450mm x 680mm(L×W×H)
WeightAbout 120 KG (depending on the actual configuration)
Power Supply220V±10V, 50Hz, the whole maximum power is 2000W
Heat dissipationExternal water circulating cooling system / internal water circulating cooling system (optional)
DetectorDPPC detector
InterfaceThe compact home wall plug provides power, and the USB interface connects to the PC for controlling the XRD
Air sourceA 2-way air supply interface is available for in-situ analysis or atmosphere protection 
SecurityThe FRINGE EV has an air spring large window lift door, which can observe the in-situ analysis process without dead angle, and can effectively shield X-Rays. It has a protection and safety interlock device that automatically cuts off during the test process. The operation interface has the function of closing the sample compartment
Cloud service capabilitiesFRINGE EV uses a synchronizable mobile APP service to support card management of diffraction data and access to knowledge management systems
CrystalX softwareLANScientific has developed a special crystal analysis software CrystalX for FRINGE EV. After obtaining diffraction data, CrystalX automatically conduct phase analysis, and give the percentage of each component of the phase, greatly reducing the requirements of the user, no manual retrieval, no need to buckle the background, no need to smooth, no need to manually peak, just need to click "start testing", the rest to the CrystalX software




Product video