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SHINE Family (Portable)

SHINE Research Edition

SHINE Research Edition

SHINE portable X-ray diffractometer is a portable X-ray diffractometer independently developed by LANScientific with the combination of XRD, XRF and computer software technologies.The samples by X-ray diffraction instrument, analysis of the diffraction pattern, material with material composition, internal information such as atomic or molecular structure or form (material ingredient, the secondary ingredients or trace elements of the crystal phase ID information), it has a simple sample preparation, no pollution, quick, high measurement precision, can get a lot of information about the integrity of the crystal, It is the main method to study the phase and crystal structure of matter.

SHINE in the X-ray beam through the sample location using transmission geometry technology, micro focus X-ray tube emission X-ray beam through the collimator irradiation powder particles in the sample pool, unique vibration system allowed more of the crystal powder particles were exposed to X-ray beam when meet the Bragg's law on CCD acquisition by the diffraction phenomenon of diffraction pattern. The sample size in the sample pool is fixed, so changes in sample density do not affect the resolution. This feature is especially important for low-density materials, such as drug samples, where higher resolution can be achieved with fixed penetration compared to instruments based on reflective geometry.



The instrument adopts waterproof and dustproof box all-in-one machine design, without any mechanical moving parts, light and compact, easy to carry, can freely conduct laboratory/field field scientific research.


XRD is integrated with XRF technology, and X-ray photon data of BOTH XRD and XRF can be collected at the same time during each test, providing material composition, phase and structure information, thus promoting more accurate test results.


The instrument is operated easily, no need for calibration, automatic detection. Real-time display of full spectrum diffraction, automatic phase analysis, one key to generate quantitative results.

Simple Sample preparation

A single analysis only needs about 20 mg of sample to obtain high quality test results. Sample preparation can be completed in 3 minutes (crushing, filtering and sampling) without making, pressing and scraping equal.

Data transmission

The instrument realizes high-speed connection with laptop computer through USB, Bluetooth, WIFI, real-time control and phase analysis of SHINE.


Professional multiple protective radiation treatment, no radiation leakage in all directions when measuring instrument.

Product parameter

XRD resolution0.2°@2θ FWHM
Scope of XRD5-55°2θ
The detector2000 X 256 pixel, 2d, level 3 Pelter refrigeration CCD
X-ray tube targetCluster microfocal spot X-ray tube, Cu or Co, Cr, Fe, Ni, Mo, Ag, W target (optional according to test sample)
X-ray tube voltageMaximum 50kV, 0-50kV adjustable
X ray tube powerMaximum 40W, 0-40W adjustable 
XRF energy resolution127eV@8keV
XRF detection rangeMg—U
Cooling MethodWater Cooling
Sample particle sizeSample particle <150um (100 mesh sieve)
Sample weightabout 20mg
Working temperature -10°C-35°C
The power supplyLithium ion battery or power adapter
CrystalX analysis software languageChinese, English and other languages