The newly launched SuperSEM N10XL desktop scanning electron microscope from Lanscientific integrates an oversized sample chamber, intelligent operation, and stable high performance, specifically designed to meet diverse sample observation needs in modern industrial inspection and scientific research. Its sample chamber can easily accommodate large or complex parts up to 100 mm in diameter and 80 mm in height, allowing users to conduct in-situ microanalysis directly on complete workpieces without cutting or damage. This significantly expands on-site inspection capabilities in fields such as semiconductor packaging, metal materials, ceramic components, and new energy batteries. The instrument employs Lanscientific's self-developed high-performance electron optical system and tungsten filament light source, enabling nanometer-resolution imaging even in low vacuum mode and facilitating efficient "place-and-see" operation.
As a modern desktop electron microscope, With its exceptional ease of use and reliable performance, the SuperSEM N10XL desktop electron microscope is becoming an ideal microanalysis tool for material testing, quality control, scientific education, and corporate R&D, making cutting-edge scanning electron microscopy technology efficient, accessible, and within reach.
In materials science, SEM clearly reveals surface microstructures, such as grain size and distribution, aiding in preliminary structural analysis. The backscattered electron detector differentiates material phases by atomic number contrast, supporting phase identification. The EDS detector enables basic composition analysis, identifying element types and approximate content. These functions provide essential microscopic data for initial material research and performance evaluation. |
Commercial manufacture In quality control and process optimization, SEM is used to inspect surface machining marks, wear, and micro-defects on components, ensuring product precision. It identifies material composition differences, helping detect impurities or inconsistencies, and analyzes material composition to verify compliance with design specifications. This aids in improving product quality, reducing defect rates, and optimizing production workflows. |
In biological applications, SEM is used to observe the surface structures of cells and tissues, clearly revealing details such as cell contours and microvilli, helping researchers understand cellular morphology and function. The backscattered electron detector distinguishes differences in cellular composition, providing preliminary information on internal cell structures. The EDS detector analyzes the distribution of elements like calcium and phosphorus within cells, supplying fundamental data for biomaterials and cell biology research. |
Earth science In Earth sciences, SEM is used to observe the morphology, size, and arrangement of mineral crystals, aiding scientists in inferring formation environments and distinguishing between different mineral compositions for intuitive rock analysis. Combined with EDS, it enables precise elemental analysis to identify mineral types, providing essential microscopic evidence for geologists studying Earth's history and geological processes. |
New energy materials In new energy materials research, SEM provides crucial microscopic insights for development and performance optimization. It clearly reveals particle size and pore structure of battery electrode materials, distinguishes between material phases, and helps assess uniformity. The EDS detector analyzes composition to ensure material purity and consistency. |
Metallic material In metallurgical analysis, SEM is used to observe the microstructure of metals, clearly revealing grain size and grain boundary morphology, providing a basis for understanding fundamental material properties. It also helps distinguish between different phases, supporting phase analysis. The EDS detector analyzes metal composition and detects impurity elements. |
| Edition | SuperSEM N10XL |
| Size（W×L×H） | 350×620×600 mm |
| Weight | 66kg |
| Acceleration voltage | 5 kV、10 kV 15 kV、20 kV |
| 3D moving sample stage | X:±50 mm Y:±50mm Z:60 mm |
| The maximum size sample | 200 mm (diameter) 60 mm (thickness) |
| Multiplying Power | ×10～×100,000（Photo magnification） ×25～×250,000（Display multiplier） |
Electron Gun | Pre-centered cartridge tungsten filament |
| Detector | BSE:High-Sensitivity 4-segment BSE detector SE:Secondary electron detector EDS：Real-time energy spectrum pseudo-color imaging |
| EDS Parameter | Detector type: silicon drift detector Detection area: 30mm2 Resolution: 130eV Range of elemental analysis: B -Cf |
| Image signal | Backscattered electron Self-developed real-time energy spectrum detector Secondary electron Mix (Backscattered electron +Secondary electron+Real-time energy spectrum pseudo-color imaging) |
| Vacuum mode | Conductor: BSE Standard Charge-up reduction |
