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FRINGE Family (Benchtop)

FRINGE PLUS

Small footprint, high power. Limited space, limitless performance.
FRINGE PLUS
FRINGE PLUS Benchtop X-ray Diffractometer is a next-generation benchtop X-ray diffraction system that integrates advanced hardware with intelligent software, designed to deliver high-precision and high-efficiency testing solutions for material analysis and industrial quality control.
Featuring a diffraction radius of ≥200 mm, a maximum output power of 3.0 kW, and the Xeye2D 2D detector, the FRINGE PLUS enables high angular resolution, high count rate, and an excellent signal-to-noise ratio. The accompanying CrystalX intelligent analysis software automatically performs phase identification, quantitative analysis, crystal structure analysis, and crystallinity determination with simple operation, making the system suitable for a wide range of fields including materials research, construction materials, metals, minerals, pharmaceuticals, and semiconductors.

--- 3 kW high power output significantly enhances XRD signal intensity and signal-to-noise ratio, greatly increasing measurement speed while enabling effective detection of weakly diffracting or trace samples

--- Equipped with the Xeye2D detector, supports seamless switching between zero-dimensional, one-dimensional, and two-dimensional modes, delivering exceptionally high diffraction intensity

--- The integrated design combines a compact footprint with high power, improving space efficiency while achieving performance comparable to floor-standing XRD systems


Advantage

High-Power Excitation System

With 3 kW output power, it significantly enhances diffraction signal intensity, making it particularly suitable for weakly diffracting samples and fast scanning scenarios, reducing measurement time while ensuring data quality.

Ultra-high efficiency

Equipped with the Xeye2D detector, it can seamlessly switch between zero-dimensional, one-dimensional, and two-dimensional modes and exhibits extremely high diffraction intensity. In 2D mode, it can also simultaneously observe the Debye ring, offering a more comprehensive view of the growth within the crystal.

Integrated design

With integrated design, compact size and built-in water circulation cooling system, it is good for space saving, easy to move and to place. It can be easily integrated into various laboratory environments.

Diverse Accessory Options

Equipped with a wide range of sample stage accessories, including rotating sample stages, temperature accessories, knife-edge accessories, battery accessories, and more, providing flexible and diverse sample analysis solutions to meet the needs of samples with different morphologies, sizes, and testing requirements, helping you explore material characteristics more comprehensively and deeply.

Multifunctional Analysis Capability

Capable of performing phase identification, crystal structure analysis, residual stress analysis, texture analysis, and more on various sample types including powders, thin films, bulk materials, and liquids, meeting diverse research and industrial needs.

Concise and Intuitive Interface Design

The CrystalX software features a clean and intuitive user interface with well-organized functional modules, allowing even first-time users to quickly get started. Complex training is not required to easily complete sample testing, data acquisition, and analysis, significantly improving work efficiency.

One-Click Intelligent Analysis

The software offers one-click testing and analysis functionality. Users only need to set a few key parameters to initiate the entire testing process, from sample scanning to data result presentation, fully automated. This minimizes manual intervention and reduces the possibility of operational errors.

Integrated Sollar Slit

Built with a vast and comprehensive standard diffraction pattern database covering diffraction data for a wide range of common substances. The database is regularly updated to ensure accurate phase identification and matching. Additionally, the software supports user-defined database additions and edits, making it convenient to expand database content according to specific research fields and requirements.

Superior Data Processing Capability

Equipped with a built-in standard database and intelligent matching functionality, it automatically compares diffraction patterns against the built-in standard substance database, enabling fast and accurate qualitative phase analysis.


Application scenario

FRINGE D200(图1)


New Energy Materials


FRINGE D200(图2)


Chemical Industry

FRINGE D200(图3)


Mining & Geochemistry and Others

FRINGE D200(图4)


Scientific Research


FRINGE PLUS(图5)


Semiconductor Industry


FRINGE PLUS(图6)


Biomedicine








Product Parameters

Goniometerθ-θ vertical goniometer, diffraction circle radius ≥200 mm
2θ Measuring range-3° - +150°
PrecisionThe  deviation of ＜±0.02° in the full spectrum
FWHM<0.04°2θ
Sola slitThe integrated sora slits, without any motion-adjustable parts, increase the reliability of the goniometer system, allowing the FRINGE desktop XRD to be installed on in-vehicle laboratory platforms
X-Ray tubeX-ray tube, metal-ceramic or corrugated ceramic tube, focal spot: (1 × 10) mm², default configuration: Cu target
Detector

Xeye2D

a) Hybrid pixel photon-counting detector, with no fewer than 65,536 sub-pixels and a pixel size no larger than 55 μm;

b) Photosensitive chip size: ≥14 × 14 mm;

c) Dynamic range: ≥1 × 10⁷ cps;

d) Detection modes: seamless switching between zero-dimensional, one-dimensional, and two-dimensional modes;

e) Energy resolution capability: automatic fluorescence background removal without the need for a monochromator.

High Voltage Generator PowerThe maximum output power of the high voltage generator is 3000W
Size765mm x 565mm x 955mm（L×W×H）
WeightAbout 170 kg (depending on the actual configuration)
Power Supply220V±10V, 50Hz
Heat dissipationExternal recirculating water cooling system
InterfaceThe compact home wall plug provides power, and the USB interface connects to the PC for controlling the XRD
Air sourceA 2-way air supply interface is available for in-situ analysis or atmosphere protection 
SecurityThe push-pull chamber door effectively shields X-rays.  FRINGE PLUS is equipped with automatic cut-off protection and a safety interlock device. When the sample chamber is closed, it is fully enclosed, and the operation interface provides an indicator showing that the sample chamber is closed.
Cloud service capabilitiesFRINGE PLUS uses a synchronizable mobile APP service to support card management of diffraction data and access to knowledge management systems
CrystalX softwareLANScientific has developed a special crystal analysis software CrystalX for FRINGE PLUS. After obtaining diffraction data, CrystalX automatically conduct phase analysis, and give the percentage of each component of the phase, greatly reducing the requirements of the user, no manual retrieval, no need to buckle the background, no need to smooth, no need to manually peak, just need to click "start testing", the rest to the CrystalX software






Contact information
No. 19 Yong'an Road,High-tech District,Suzhou, China.
Telephone: +86-512-67370735
Email: annli@lanscientific.com
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