The internal structure of metallic materials usually requires sample preparation steps such as cutting, mounting, grinding, polishing, and etching before observation. Desktop scanning electron microscopy (SEM) can be used to analyze grain size, phase composition, inclusions, precipitates, voids, microcracks, segregation, coating structure, weld heat-affected zone, and additive manufacturing melt pool microstructure. Secondary electron (SE) imaging can be used to observe microstructural morphology, while backscattered electron (BSE) imaging can differentiate different phases based on atomic number contrast. Combined with energy-dispersive X-ray spectroscopy (EDS), the chemical composition of each phase can be further determined. This capability can be applied to heat treatment process evaluation, casting microstructure analysis, welding quality assessment, powder metallurgy microstructure observation, additive manufacturing material research, and microstructural tracing in failure analysis.
