ScopeX G59 is a high-precision instrument specially designed for 99999 gold showroom and ultra-high purity gold analysis. As one of the flagship products of LANScientific, ScopeX G59 is equipped with large area detector with ultra-sensitive analysis function. Collimators of different sizes enables analysis of very small samples. Large sample chamber can meet the analysis requirement of different size samples.
Adopting brand new vertical optical path system, ScopeX G59 can carry out rapid and non-destructive analysis of not only gold (Au) content, but also very small impurity silver (Ag) and copper (Cu) with limit of detection(LOD)≤ 10ppm. It meets the analysis requirements on gold from 99.99%to 99.999%. Ultra-high precision analysis within 0.001% (10ppm impurity) makes it the ideal choice for 99999Au showroom and ultra-high purity gold analysis.
It can quickly and non-destructively analyze the gold content and impurities such as silver and copper, and ensure that the color and purity of jewelry meet the standards. It is widely used in raw material inspection, production process control, quality control and finished product inspection of jewelry factories, as well as precious metal detection in gold shops and jewelry exhibition halls. |
It can detect trace impurity elements in high purity gold, provide accurate composition analysis for the manufacturing of high purity gold nanomaterials, and help to develop high performance nano-sensors, nano-catalysts, functional coatings, etc. |
In the aerospace sector, the ScopeX G59 is used to detect impurities in high-purity gold materials to ensure that their purity meets aviation-grade standards to meet the strict requirements of aerospace components for material performance and reliability. |
High-purity gold is extensively used in critical components such as electronic devices, chip bonding wires, high-end contacts, and packaging. Impurities in these components can significantly affect the electrical performance and long-term reliability of electronic devices and integrated circuits. Therefore, ScopeX G59 plays a crucial role in detecting trace impurities and ensuring purity meets the extremely stringent standards required for electronics and semiconductor manufacturing. |
| Type | Benchtop |
| Weight | 46kg |
| Size | 570mm×400mm×400mm（L×W×H） |
| Sample chamber size | 365mm×300mm×78mm（L×W×H） |
| Detection range | Al-U |
| Language | Multi languages including Chinese, English |
| Detector | Ultra-large area SDD detector with bringing excellent counting rate and energy resolution |
| Optical structure | Vertical |
| Tube window | Beryllium window |
| Collimator | 0.5mm/1.0mm/2.0mm/3.0mm are switchable for users to flexibly choose according to analysis requirements and sample characteristics, ensuring the best XRF performance. |
| Filter | Automatic switchable multi-filter can significantly improve the quality and efficiency of analysis, better adapting to different analysis scenarios, providing users with more accurate and reliable results. |
| Accuracy | ±0.001% |
| Computer parameter | I5 quad core |
| Data printing | Bluetooth printer |
| Algorithm | ScopeX G59 adopts curve calibration method and fundamental parameter(FP) method to remove background difference, reduce error and improve test accuracy. |
| One-click test button | Included |
| Camera | 5 megapixel HD CMOS color camera |
