The FRINGE CLASS desktop X-Ray diffractometer is a versatile powder diffraction analysis instrument that is widely used in research, materials science and chemistry, as well as industrial research and quality control.
The ideal tool for analytical applications in materials research, biomedicine, minerals, plastics, semiconductors and many other fields
It can be used for qualitative and quantitative analysis, crystal structure analysis, material structure analysis and crystallinity determination of powder, block or thin film samples.
The FRINGE EV benchtop X-Ray diffractometer has a compact size, eliminates the need for complex laboratory facilities, and a standard wall plug and a few minutes to get him excellent results.
Designed for materials science research and industrial quality control, this instrument is characterized by high precision, accuracy, and stability, making it suitable for a wide range of applications. It offers users convenience and efficiency in material analysis.It is the ideal choice for scientific research and industrial production.
With its built-in high-precision θ-θ vertical goniometer, Xeye2D detector, and independent CrystalX analysis software.This instrument can easily identify physical phases, analyze crystal structures, measure residual stress, and evaluate the composition of various sample types (including powder, film, bulk, and liquid). This versatility meets a wide range of scientific research and industrial requirements.
Integrating a 3.0 kW high-power X-ray source with the Xeye 2D detector, it effortlessly achieves higher excitation efficiency and superior signal-to-noise ratio, significantly accelerating phase analysis speed and improving diffraction data quality for complex samples.
Designed for laboratory automation and high-throughput analysis, it enables seamless end-to-end automated analysis—from continuous auto-sampling and unattended testing to intelligent data processing—significantly enhancing the level of laboratory intelligence.
