Polycrystalline nanoscale film is a film material with multiple crystal grains and the grain size is in the nanometer range. This material has a wide range of applications in fields such as nanotechnology, materials science and engineering. X-ray diffraction (XRD) can help determine the crystal structure type, lattice parameters and existing crystal phases of the film in the qualitative analysis of polycrystalline nanoscale films. In addition, factors such as grain size and lattice distortion can also be estimated by XRD analysis of the width of the diffraction peak to ensure accurate and reliable qualitative analysis of the film structure.
Reflection measurement, density, thickness and roughness detection are of great significance for understanding the optical, physical and chemical properties of films and optimizing the film preparation process. These parameters are critical factors in determining film performance and behavior in many applications.
