XAFS (X-ray Absorption Fine Structure) reveals atomic-scale local chemical environments and structural details by measuring variations in a material's absorption coefficient of monochromatic X-rays with energy. Its core principle involves: when incident X-ray energy matches the binding energy of inner-shell electrons of a specific element in the sample, ionization occurs, creating a characteristic absorption edge. Beyond the edge, the emitted photoelectron wave is scattered by neighboring atoms and interferes with the outgoing wave, producing fine oscillations in the absorption spectrum. Through mathematical transformation, these oscillations yield key structural parameters—such as neighboring atom types, bond lengths, coordination numbers, and disorder—around the absorbing atom, effectively capturing a "local snapshot" of its immediate surroundings.

This instrument successfully replicates the powerful synchrotron-based technique in conventional laboratory settings by integrating a high-brightness X-ray source, a spherically bent crystal focusing monochromator, and high-resolution detectors, enabling convenient and precise analysis of material electronic structures and atomic configurations.