X-Ray diffraction (XRD) has important applications in stress analysis of metallic materials. Metal materials will produce internal stress distribution under the action of force, affecting their performance and stability. XRD can measure tiny distortions in the crystal lattice, thereby inferring the stress state in the material. By analyzing the displacement and width of the diffraction peak, stress values, including residual stress and loading stress, can be calculated, providing important information for optimizing material processing and design, thereby improving the performance and reliability of metal materials.
XRD is widely used in materials science and engineering, providing researchers with a very powerful tool. The grain size of a metal directly affects its mechanical properties and microstructure. XRD can indirectly estimate the grain size by measuring the width of the diffraction peak, and use the Scherrer formula to calculate the grain size information of the material.
On the other hand, metal materials will undergo microscopic strain during the loading process, which affects the spacing of the crystal lattice. XRD can analyze these tiny lattice changes to quantitatively measure the microscopic strain of the material. This is important for evaluating the deformation mechanism, plastic deformation characteristics and strain distribution of the material.
