In the semiconductor industry, the purity of the material and trace element control are crucial to ensure product quality. XRF, TXRF and other analytical instruments are widely used as highly efficient analytical tools: Impurity detection: To detect trace impurities in silicon wafers and semiconductor materials, such as metal impurities in silicon wafers, such as iron, copper, nickel, chromium, etc., the concentration of these elements usually needs to be controlled at ppb (one in a billion) or even lower. Production control: Applications in production control include periodic testing of raw materials, intermediate products, and final products to monitor changes in chemical composition during the production process. To ensure the high purity and consistency of the semiconductor materials.
