To optimize the diffraction experiment conditions to obtain a better diffraction pattern, the following points can be considered:
1.Choose appropriate wavelength and incidence angle in order to make diffraction peak clearly visible and maximize diffraction intensity.
2. Use appropriate sample preparation methods to ensure that the sample is fine and even powder and avoid aggregation or uneven granules.
3. Ensure the correct geometric configuration of the diffractometer and perform instrument calibration and adjustment.
4. Keep the laboratory environment quiet during the experiment. Avoid interference and radiation sources.
5. For complex samples or cases in which diffraction is difficult, users can consider using higher resolution diffractometers or applying other diffraction techniques to perform auxiliary analysis.
To optimize the conditions of X-ray diffraction experiments to obtain better results, the following points can be considered:
1. Ensure that the X-ray tube and detector perform well and make necessary calibration and adjustment.
2.Choose appropriate wavelength and incidence angle in order to make diffraction peak clearly visible and maximize diffraction intensity. Incidence angle can be adjusted according to characteristics of samples and the required diffraction information.
3.Ensure the quality and homogeneity of sample preparation. Avoid the influence of aggregation and inhomogeneity on diffraction results.
4.Keep the laboratory environment stable and quiet during the experiment to reduce interference and background noise.
5.Background deduction, background fitting and other treatments can be made as needed to reduce the impact of background.
6.For complex samples or difficult diffraction cases, other diffraction techniques or methods, such as inverse transformation method, particle beam diffraction can be used as auxiliary analysis.
Background deviation or shift may be due to problems relating to instrument or samples. First, users should check whether the calibration and adjustment is correct, then ensure that the incidence angle and instrument geometry are configured correctly, check the performance of the light source and detector. Second, the background deviation may also be caused by the presence of other components or impurities in the sample. It’s advised to use pure samples as much as possible, and make background compensation or deduction treatment.
Determining crystal structures in diffraction patterns often involves complex processes of crystallographic analysis and structure analysis, which normally requires calculation and model fitting using diffraction data. With the help of appropriate software and computational tools, crystal structure can be analyzed by information such as diffraction pattern’s peak position, intensity, relative intensity. A common approach is to calculate the diffraction angle and diffraction intensity from the peak positions and intensities of the diffraction pattern, and then perform model fitting and crystal structure analysis using crystallographic software.
The larger width of diffraction peak may be caused by many factors. First, the diffraction peak width is related to the crystal size and structure. Larger crystal sizes generally lead to larger diffraction peaks. Second, the diffraction peak width may also be limited by the resolution of the diffractometer. It’s suggested to check the diffractometer’s resolution and calibration condition, ensuring appropriate instrument settings and conditions are set up.
The tilt or uneven distribution of the samples may cause the distortion or ambiguity of the diffraction pattern. The solution to this problem is to ensure that the samples are evenly spread over the sample stage of the diffractometer and use the appropriate amount of sample powder to avoid too much or too little. It should also be ensured that the balance and level of the sample table are adjusted correctly.
Background noise and stray may be due to various reasons.
Firstly, It may be caused by interference in the environment or radiation sources. Users are suggested to keep laboratory environment quiet and avoid close proximity to other radiation sources (such as light sources, electronic equipment).
Secondly, the noise may also be caused due to impurities or impure substances in the sample. Users are advised to use pure samples as much as possible and check whether other impurities exist.
There are several reasons that may prevent producing clear diffraction pattern of samples.
Firstly, it should be ensured that sample is powder that has been finely ground enough instead of aggregated granular. Secondly users should check whether diffractometer is adjusted and aligned well, and ensure sample is placed in the right position. Parameters of diffractometer such as incident angle, wavelength should be set correctly as well.
Atmospheric heavy metal online analyzer can be installed in the monitoring station room, can also be installed in the mobile monitoring car.
Yes, the instrument comes with 4G/5G communication network, so you can operate the instrument remotely without WIFI or router.
