In the semiconductor industry, the purity of the material and trace element control are crucial to ensure product quality. XRF, TXRF and other analytical instruments are widely used as highly efficient analytical tools: Impurity detection: To detect trace impurities in silicon wafers and semiconductor materials, such as metal impurities in silicon wafers, such as iron, copper, nickel, chromium, etc., the concentration of these elements usually needs to be controlled at ppb (one in a billion) or even lower. Production control: Applications in production control include periodic testing of raw materials, intermediate products, and final products to monitor changes in chemical composition during the production process. To ensure the high purity and consistency of the semiconductor materials.
TXRF technology can be used for the qualitative and quantitative analysis of nanomaterials to help researchers understand the composition and distribution of materials: Nanoparticle analysis: Nanoparticles play a key role in many high-tech applications, including biomedical, catalysts, electronic and optical equipment. The
TXRF technology enables a precise analysis of the composition and surface coatings of these nanoparticles.
Nanocomposites research: By combining the nanoscale components of different materials, nanocomposites can produce new materials with unique physical, chemical and mechanical properties.
XRF, TXRF technologies have significant advantages in studying the components and proportions of these composites.
For example, with TXRF, researchers can accurately analyze and compare the content of metal elements in different nanocomposites, thus optimizing the properties such as hardness, wear resistance and corrosion resistance.
