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Scanning electron microscope (SEM)

Breaking through traditional boundaries with innovative technology (real-time joint analysis of electron microscope (SEM) and energy dispersive X-ray spectroscopy (EDS) detector), it provides an unprecedented experience in exploring the microscopic world. With excellent nanoscale resolution, user-friendly operation interface and fast imaging capabilities, it can easily meet the high-precision analysis needs in the fields of materials science, biomedicine and nanotechnology.

Portability

Small size, improved experimental flexibility

Real-time analysis

Combination of SEM and EDS to obtain structural and composition information in real time

Fast scanning speed

Real-time observation of samples in video mode