Scanning electron microscope (SEM)
Breaking through traditional boundaries with innovative technology (real-time joint analysis of electron microscope (SEM) and energy dispersive X-ray spectroscopy (EDS) detector), it provides an unprecedented experience in exploring the microscopic world. With excellent nanoscale resolution, user-friendly operation interface and fast imaging capabilities, it can easily meet the high-precision analysis needs in the fields of materials science, biomedicine and nanotechnology.