The FRINGE CLASS desktop X-Ray diffractometer is a versatile powder diffraction analysis instrument that is widely used in research, materials science and chemistry, as well as industrial research and quality control.
It can be used for qualitative and quantitative analysis, crystal structure analysis, material structure analysis and crystallinity determination of powder, block or thin film samples.
The FRINGE EV benchtop X-Ray diffractometer has a compact size, eliminates the need for complex laboratory facilities, and a standard wall plug and a few minutes to get him excellent results.
The ideal tool for analytical applications in materials research, biomedicine, minerals, plastics, semiconductors and many other fields
By X-Ray diffraction technology and full spectrum fitting method, we can calculate and analyze the crystallinity of polymer material samples, which is an ideal tool for polymer material industry analysis!