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  • X-ray Diffractometers

    At present, X-ray diffraction is the most powerful method to study the phase and crystal structure of materials by analyzing the diffraction pattern of powder, single crystal or polycrystal samples and obtaining information about the composition of materials as well as the structure or morphology of atoms or molecules inside materials.

SHINE Family (Portable)

It can detect and analyze related materials (ore, corrosion and other compounds, etc.) in the field environment, and quickly provide users with the information of the main and secondary components of the sample.

FRINGE Family (Benchtop)

It can quickly perform qualitative, quantitative analysis, crystal structure analysis, material structure analysis and crystallinity determination of samples in the form of powder, block or film.